FEI STRATA DB237

Manufacturer: FEI
Product condition: Deinstalled (re-installation possible)
Vintage:

Price: click here for enquiry
SKU: FIB-FEI-003 Category:

All our used electron microscopes are certified second hand equipment

  • Condition certificate provided
  • On-site installation
  • No-Risk warranty period

Description

Beam performance
< 3 nm @ 1 kV, 2 mm WD
< 3 nm @ 5 kV, 5 mm WD
< 3 nm @ 30 kV, 7 mm WD

Detectors
SED
CDEM
TLD*
STEM detector

50x50mm Stage
repeatability with Ebeam at 0° tilt : X<1µm; Y<1µm
repeatability with Ibeam at 52° tilt : X<2µm; Y<2µm
Accuracy : with Ebeam at 0° tilt : X<2µm; Y<2µm
Accuracy : with Ibeam at 52° tilt : X<4µm; Y<4µm
flip stage with tem grid holder

GIS
STEM detector
Platinum Deposition (Pt)
XeF2 (IEE)
omniprobe 100

WD for EDX: 5mm

Vacuum
10-6 mbar range after 24H of pumping

Additional information

Manufacturer

FEI

Product condition

Deinstalled (re-installation possible)

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