FEI Quanta 450 ESEM

Manufacturer: FEI
Product condition: Installed and running (sample job available)
Vintage: 2012

Price: click here for enquiry
SKU: SEM-FEI-002 Category:

All our used electron microscopes are certified second hand equipment

  • Condition certificate provided
  • On-site installation
  • No-Risk warranty period

Description

MAIN FEATURES

RESOLUTION
• High vacuum
– 3.0 nm at 30 kV (SE)
– 4.0 nm at 30 kV (BSE)*
– 8.0 nm at 3 kV (SE)
• High vacuum with beam deceleration option
– 7.0 nm at 3 kV (BD mode* + vCD*)
• Low vacuum
– 3.0 nm at 30 kV (SE)
– 4.0 nm at 30 kV (BSE)*
– 10 nm at 3 kV (SE)
• Extended vacuum mode (ESEM)
– 3.0 nm at 30 kV (SE)

DETECTORS
Everhardt Thornley SED (secondary electron detector)
• Large Field Low vacuum SED (LFD)
• Gaseous SED (GSED) (used in ESEM mode)
• High sensitivity low kV SS-BSED*
• IR camera for viewing sample in chamber
• Gaseous BSED (BSE detector for high pressures, used in ESEM
mode)*
• 4 quadrant solid-State BSED* TBD
• Scintillator BSED/CLD* TBD
• vCD (low voltage high contrast detector)* TBD
• Electron beam current measurement*TBD
• Gaseous analytical BSED (GAD)* TBD

STAGE
• X-Y = 100 mm
• Z = 60 mm
• Z clearance = 75 mm
• T = – 5° to + 70°
• R = 360° continuous
• Repeatability: 2 µm (x and y)
• Tilt-eucentric at 11.3 mm mounting height for all working distances
• x and y movements are in the tilt plane
10 mm analytical WD

ACCESSORIES
Support PC
Manual User Interface
Joystick

Additional information

Manufacturer

FEI

Product condition

Installed and running (sample job available)

Vintage

2012