Dual Beam Scanning Electron Microscope (SEM / FIB)
EDAX EDS
PHILIPS/FEI Versa 3D LoVac
Manufacturer: FEI
Product condition: Installed and running (sample job available)
Vintage: 2014
Price: click here for enquiry
SKU: FIB-FEI-007
Category: FIB
All our used electron microscopes are certified second hand equipment
- Condition certificate provided
- On-site installation
- No-Risk warranty period
Description
Additional information
Manufacturer | FEI, PHILIPS |
---|---|
Product condition | Installed and running (sample job available) |
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