** MAIN FEATURES **
This FEI Tecnai F30 is a 300 kV analytical TEM designed for high-resolution TEM, STEM, EELS, and EDS. Suitable for materials science, nanoparticles, catalysts, semiconductors, and general high-resolution imaging. FEI Tecnai F30 uses a Super-Twin objective lens enabling sub-nanometer resolution.
** BEAM **
– Type of emitter: Field Emission Gun (FEG)
– Acceleration voltage range: 60–300 kV
** RESOLUTION **
– Point resolution: 0.24 nm
– Line resolution: 0.14 nm
** DETECTORS **
– EDAX TEAM Octane T Optima SDD EDS (windowless)
– STEM detectors: off-axis BF, DF, on-axis HAADF
– Gatan GIF 200 with 1k Multiscan camera (defective, can be repaired)
– Gatan MSC 794 bottom-mounted CCD (operational)
** STAGE **
– Five-axis motorized goniometer stage
– Movement range: X/Y ±1.5 mm, Z ±1 mm
– Tilt angle: up to ±40° depending on holder
– Axes: X, Y, Z, alpha, beta
** ACCESSORIES **
– Gatan instrumentation bin and controllers (FireWire)
– EDAX Z1 Analyzer electronics
– Water chillers: Haskris unit and Keil unit
– Edwards backing pump
– High-tension tank
– Windows XP control computer
– Windows 7 computer for EDAX TEAM system
– STEM scan generator and STEM detection amplifiers
– “Compucentricity, FreeLensControl, SmartTilt, and other FEI automation modules typical for Tecnai series”
** CONDITION **
– FEG with approximately 6000 h operate and 50 h standby (almost new)
– GIF-CCD ; EELS will be repaired on demand.
– Vacuum status shows excellent column vacuum (IGP2 around 1×10⁻⁸ mbar equivalent).
