FEI STRATA 400
FIB-FEI-005-DSC07091
FIB-FEI-005-DSC07015
FIB-FEI-005-DSC07033
FIB-FEI-005-DSC07032
FIB-FEI-005-DSC07025
FIB-FEI-005-DSC07024
FIB-FEI-005-DSC07036
FEI STRATA 400
FIB-FEI-005-DSC07091
FIB-FEI-005-DSC07015
FIB-FEI-005-DSC07033
FIB-FEI-005-DSC07032
FIB-FEI-005-DSC07025
FIB-FEI-005-DSC07024
FIB-FEI-005-DSC07036

FEI STRATA 400

Manufacturer: FEI
Product condition: Installed and running (sample job available)
Vintage: 2004

Price: click here for enquiry
SKU: FIB-FEI-005 Category:

All our used electron microscopes are certified second hand equipment

  • Condition certificate provided
  • On-site installation
  • No-Risk warranty period

Description

** MAIN FEATURES **

** BEAMS **
Electron source Schottky thermal field emitter
Ion source Gallium liquid metal
Beam voltage
SEM 200 V – 30 kV
FIB 500V – 30 kV

** RESOLUTION **
Visual resolution@ 1kV : 2.5nm
Visual resolution@ 15kV : 1 nm
Image resolution < 0.8 nm achievable in SEM-STEM mode

** DETECTORS **
ETD (chamber)
CDEM (chamber)
TLD (In-lens)

** STAGE **
X and Y repeatability at 0° tilt 150 degrees (excluding tilt of main
DualBeam stage)
External load base for loading/unloading grids from row
holder
In-situ section extraction system
SEM-STEM detector Multi-region: bright field, dark field, 12 high-angle dark
field segments
User interface Windows 2000® GUI with integrated SEM, FIB, GIS,
imaging and patterning
Simultaneous patterning and imaging mode

Additional information

Manufacturer

FEI
Product condition

Installed and running (sample job available)
Vintage

2004

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