** MAIN FEATURES **
The NOVA NanoSEM 230 is a Schottky Field Emission Scanning Electron Microscope (FESEM) that combines high- and low-voltage ultra-high resolution capabilities with the low-vacuum, high-resolution imaging solution. It can be applied to the morphology observation, elemental composition and distribution detection, structure and orientation analysis for a variety of challenging material, such as metal, nano-particles and powder, nanotubes and nanowires, porous material (silicon, hydroxyapatite), plastic-electronics, glass matrix material, organic material, macromolecule material, diamond film, semiconductor, crystal materials, biological samples, and all kinds of membrane material and cross section.
** BEAM **
- High stability Schottky field emission gun
- Beam landing energy: 50 V – 30 kV
** RESOLUTION **
- Resolution @ optimum WD
- 1.0 nm at 15 kV (TLD-SE)
- 1.6 nm at 1 kV (TLD-SE)
** DETECTORS **
- In-lens SE detector (TLD-SE)
- In-lens BSE detector (TLD-BSE)
- Everhardt-Thornley SED
- Low vacuum SED (LVD)
- IR-CCD
- Low-voltage High-contrast back scattered detector (vCD)
** STAGE **
- 4-axes motorized stage
- Eucentric goniometer stage
- X = 50 mm
- Y = 50 mm
- Z = 50 mm (25 mm motorized)
- T = -15° – + 75° (manual)
- R = 360° continuous
- Repeatability: 2 μm
** ACCESSORIES **
- Chiller, vacuum pump
- Sample holders, multifunctional control panel and joystick
- Specimen holder kit
** CONDITION **
- Maintained under the FEI service contract.
- Maintenance and FEG replacement in June 2024.
