** MAIN FEATURES **
This Tescan scanning electron microscope is equipped for high-quality imaging and microanalysis.
Suitable for research and industrial applications in materials science, semiconductors, and life sciences.
The system operates with Tescan software v3.4.2.1 on a Windows XP computer and includes an Oxford Instruments EDX microanalysis system.
** BEAM **
– Electron source: Tungsten thermionic emitter
– Acceleration voltage: 200 V – 30 kV
– Beam current: up to ≈2 µA
– Spot size: ≈3 – 5 nm (depends on settings and working distance)
– Probe current control: continuously variable
** RESOLUTION **
– 3.5 nm at 30 kV (SE mode, high vacuum)
– 4.5 nm at 30 kV (BSE mode)
** DETECTORS **
– LVST (Low Vacuum Secondary Electron) detector
– 4-quadrant semiconductor backscattered electron (BSE) detector
– Chamber view camera
– Oxford Instruments INCA 250 XT EDX system (INCA x-act PentaFET Precision)
• Model: 51-ADD0048, Sensor: 51-1385-005
• Resolution at 5.9 keV: 133 eV
– Oxford INCA Suite software v4.12 running on Windows XP
** STAGE **
– Motorized stage with rotation and tilt
– Accommodates up to 7 sample stubs
** ACCESSORIES **
– Trackball control
– Standard vacuum components and PC control system
** CONDITION **
Operational condition not specified.
Software and detectors verified to run under Windows XP.
No OEM service contract information available.
