Premium BSE detector

Premium BSE detector is our highest performance Si-based detector for materials science, geology and industrial applications.

A four-quadrant sensor geometry is used, coupled with four independent in-situ preamplifiers, to give full flexibility for the traditional COMPO and TOPO modes, or the new calibrated 3D measurement mode with topographic reconstruction.

A motorised insertion/retraction mechanism is included, with alignment table for the left/right and up/down directions, and bellows for reliable vacuum. An optional MICS-4 amplifier can be embedded into the detector, for a fully self-contained detector with quantitative amplification, independent brightness and contrast controls, and hardware signal mixing.

Premium BSE sensor
* detector-grade Si chip
* four-quadrant (4Q) geometry
* * chip on ceramic board mount
* 6 mm inner diameter
* 20 mm outer diameter
* 1 kV minimum acceleration voltage

In-situ preamplifier
* in situ mount
* 105 V/A gain
* 200 ns minimum dwell time (gain dependent)

Mechanics (LIMA)
* Port mounted, with vacuum bellows
* Motorized insertion/retraction motion
* -4…4 mm manual lateral and height alignment
* 10 µm repositioning step size
* Integrated touch alarm, with automatic stop and retraction
* Passive cooling

Main amplifier (MICS-4) (optional)
* 4x independent signal channels
* -1.25 … 1.25 V (-50…50 mV with attenuator) input offset
* 1x … 1,800x gain
* -1.25 … 1.25 V output offset
* 3.4 MHz…34 Hz low-pass filter
* Automated 4Q global brightness and contrast
* Automated input offsets (dark correction)
* Automated gain normalization (bright correction)
* COMPO hardware mix signal (sum of BSE1…BSE4)
* TOPO hardware mixed signal (mix of BSE1…BSE4)

Software – Control
* Detector drawing with selectable quadrants
* Bias, brightness and contrast controls
* Individual quadrants, or grouped COMPO/TOPO control
* Automatic go to inserted/retracted positions
* Fine repositioning/adjustments in mm units
* Windows 11 … Windows 7

Software – Automation
* XML file format open/save settings
* JSON/RPC interface for remote control
* Automated brightness and contrast

SKU: UPG-PTE-013 Category: Tags: ,

All our used electron microscopes are certified second hand equipment

  • Condition certificate provided
  • On-site installation
  • No-Risk warranty period

Description

Premium BSE detector is our highest performance Si-based detector for materials science, geology and industrial applications.

A four-quadrant sensor geometry is used, coupled with four independent in-situ preamplifiers, to give full flexibility for the traditional COMPO and TOPO modes, or the new calibrated 3D measurement mode with topographic reconstruction.

A motorised insertion/retraction mechanism is included, with alignment table for the left/right and up/down directions, and bellows for reliable vacuum. An optional MICS-4 amplifier can be embedded into the detector, for a fully self-contained detector with quantitative amplification, independent brightness and contrast controls, and hardware signal mixing.

Premium BSE sensor
* detector-grade Si chip
* four-quadrant (4Q) geometry
* * chip on ceramic board mount
* 6 mm inner diameter
* 20 mm outer diameter
* 1 kV minimum acceleration voltage

In-situ preamplifier
* in situ mount
* 105 V/A gain
* 200 ns minimum dwell time (gain dependent)

Mechanics (LIMA)
* Port mounted, with vacuum bellows
* Motorized insertion/retraction motion
* -4…4 mm manual lateral and height alignment
* 10 µm repositioning step size
* Integrated touch alarm, with automatic stop and retraction
* Passive cooling

Main amplifier (MICS-4) (optional)
* 4x independent signal channels
* -1.25 … 1.25 V (-50…50 mV with attenuator) input offset
* 1x … 1,800x gain
* -1.25 … 1.25 V output offset
* 3.4 MHz…34 Hz low-pass filter
* Automated 4Q global brightness and contrast
* Automated input offsets (dark correction)
* Automated gain normalization (bright correction)
* COMPO hardware mix signal (sum of BSE1…BSE4)
* TOPO hardware mixed signal (mix of BSE1…BSE4)

Software – Control
* Detector drawing with selectable quadrants
* Bias, brightness and contrast controls
* Individual quadrants, or grouped COMPO/TOPO control
* Automatic go to inserted/retracted positions
* Fine repositioning/adjustments in mm units
* Windows 11 … Windows 7

Software – Automation
* XML file format open/save settings
* JSON/RPC interface for remote control
* Automated brightness and contrast

Additional information

Manufacturer

PTE

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