Estimated configuraton:
– Omniprobe
– Pt GIS – Retractable Low-kV, High-contrast Detector (vCD)
– Retractable Annular STEM Detector
– ICE Detector
– Charge Neutralizer
– AutoFIB
– AutoTEM G2
– AutoSlice and View G2
– ResolveRT FEI Edition
– Automation License
– GDStoDB Software
– Manual User Interface
Helios NanoLab 650
Manufacturer: FEI
Product condition:
Vintage: 2011
Price: click here for enquiry
SKU: FIB-FEI-006b
Category: FIB
All our used electron microscopes are certified second hand equipment
- Condition certificate provided
- On-site installation
- No-Risk warranty period
Description
Additional information
Manufacturer | FEI |
---|---|
Vintage | 2011 |
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