FEI Nova nanosem 450 FEG

Manufacturer: FEI
Product condition: Installed and powered off (power on possible)
Vintage: 2012

Price: click here for enquiry
SKU: SEM-FEI-001 Category:

All our used electron microscopes are certified second hand equipment

  • Condition certificate provided
  • On-site installation
  • No-Risk warranty period

Description

MAIN FEATURES

RESOLUTION
• High vacuum imaging, optimum WD
– 0.8 nm at 30 kV (STEM)
– 1.0 nm at 15 kV (TLD-SE)
– 1.4 nm at 1 kV (TLD-SE) without beam deceleration
– 3.5 nm at 100 V (DBS)
• High vacuum analysis, analytical WD
– 3.0 nm at 15 kV and 5 nA (TLD-SE)
• Low vacuum imaging, optimum WD
– 1.5 nm at 10 kV (Helix detector)
– 1.8 nm at 3 kV (Helix detector)

DETECTORS
• In-lens SE detector (TLD-SE)
• In-lens BSE detector (TLD-BSE)
• Everhardt-Thornley SED
• Low vacuum SED (LVD)
• IR-CCD
• High sensitivity low kV Directional Backscattered Detector (DBS),
lens-mount* or retractable*???tbd
• TV-rate low vacuum solid-state BSED (GAD)*???tbd
• UHR low vacuum SED (Helix detector)*???tbd

STAGE
Type : Eucentric goniometer stage, 5-axes motorized
XY: 110x110mm DC motors
Repeatability < 2.0 µm (@0° tilt)
Z : 25 mm
R: nx360°
Tilt: -15°/+75°
Max. sample height Clearance 60 mm to eucentric point
Max. sample weight 500 g in any stage position
(up to 2 kg at 0°tilt)
Max. sample size Ø150 mm with full rotation (larger samples possible with limited rotation)
Analytical working distance: 5 mm

ACCESSORIES
GIS carbon
GIS platinum
Plasma cleaner

Additional information

Manufacturer

FEI

Product condition

Installed and powered off (power on possible)

Vintage

2012