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Headquarters

24 rue du Gouverneur Général Eboué
92130 Issy-les-moulineaux, FRANCE
+33 1 89 70 62 64

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Support

+33 1 89 70 62 64 ext. 2
https://support.regenmicroscopy.com

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Our microscopy technologies

REGEN Microscopy offers a complete line of remanufactured electron microscopes, each designed to meet specific research and analysis needs.

Application sectors
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Scanning Electron Microscope (SEM)

Ideal for surface analysis, with detailed images of sample morphology and composition.

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Transmission Electron Microscope (TEM)

Perfect for the study of ultrastructure, allowing fine observations of cells and materials.

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Focused Ion Beam Microscope (FIB)

Used for sample preparation, nanofabrication and high-resolution analysis.