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Headquarters
24 rue du Gouverneur Général Eboué
92130 Issy-les-moulineaux, FRANCE
+33 1 89 70 62 64
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Our microscopy technologies
REGEN Microscopy offers a complete line of refurbished electron microscopes, each designed to meet specific research and analysis needs.
Scanning Electron Microscope (SEM)
Ideal for surface analysis, with detailed images of sample morphology and composition.
Transmission Electron Microscope (TEM)
Perfect for the study of ultrastructure, allowing fine observations of cells and materials.
Focused Ion Beam Microscope (FIB)
Used for sample preparation, nanofabrication and high-resolution analysis.