OXFORD X-Max 80sqmm

Manufacturer: OXFORD
Product condition: Installed and running (sample job available)
Vintage: 2014

Price: click here for enquiry
SKU: ACC-OXF-002 Category:

All our used electron microscopes are certified second hand equipment

  • Condition certificate provided
  • On-site installation
  • No-Risk warranty period

Description

Complete with Interfaces, PC and SW.

Applications of EDS:
Measure the elemental composition of a point of interest
Measure the elemental composition of an area of interest
SEM – Elemental Composition

EDS (EDX) on SEM

EDS (EDX) Analysis provides elemental analysis of a sample inside a SEM, TEM or FIB. Our new AZtec from Oxford is a new and revolutionary materials characterisation system that gathers accurate data at the micro- and nanoscales.
Launched in 2011, AZtec-Energy combines the latest generation of detector hardware, multi-tasking software, decades of EDS know-how and feedback from the world’s largest user community to create a platform that pushes back the boundaries of EDS analysis.
EDS analysis – Nanolab Technologies

X-MaxN Features

The X-MaxN is a SDD detector resolution and low energy detectability is independent of sensor size because of its external FET design.
The same sensor position means that the count rate simply increases in proportion to sensor size
The same outstanding resolution performance is guaranteed on all sensor sizes
Excellent low energy analysis, including Be detection on all sensor sizes
X-MaxN Features

X-MaxN Benefits

Productive count rates at low beam currents
Maximising imaging performance and accuracy
No need to change imaging conditions for X-ray analysis
Significantly higher count rates at the same beam current
Shorter acquisition times
Better statistical confidence
Practical analysis with small beam diameters
Maximising spatial resolution
Getting the best out of your high resolution SEM

Additional information

Manufacturer

OXFORD

Product condition

Installed and running (sample job available)

Vintage

2014