** MAIN FEATURES **
– Transmission Electron Microscope Equipped with Gatan OneView camera (2022) and imaging corrector for enhanced resolution.
– S-FEG electron source
– Designed for atomic-scale imaging and nano-analysis in materials science and nanotechnology
** BEAM **
– Emitter type: S-FEG
– Accelerating voltage range: 80-300 kV
– Brightness: ~10^8 A cm-2 sr-1
– 3-condenser lens illumination system
** RESOLUTION **
– TEM information limit: 0.10 nm
– STEM-HAADF resolution: 0.136 nm
** DETECTORS **
– 16-megapixel CMOS camera (Gatan OneView) for TEM
– HAADF detector for STEM
– Energy-Dispersive X-ray Spectroscopy (EDXS), retractable EDAX detector
– Effective solid angle: 0.13 sr
– Energy resolution: 136 eV (Mn-Kalpha)
– Element detection capability: Z >= 5
– Electron Energy-Loss Spectroscopy (EELS)
– Energy-Filtered TEM (EFTEM)
– Gatan GIF Tridiem 863 energy filter
– 4-megapixel CCD camera (Gatan UltraScan 1000)
– EELS energy resolution: 0.7 eV
** STAGE **
– Standard Titan goniometer
– Single-tilt specimen holder
** ACCESSORIES **
– Integrated operator console with dual monitors
– Dedicated microscope control panels
– Bottom-mounted TEM camera housing
– Oil-free vacuum pump system integrated in lower cabinet
– Acoustic enclosure around column base
** CONDITION **
– System installed in laboratory environment
– Maintained under TSF annual service contract
