FEI Quanta 200 W SEM

Manufacturer: FEI
Product condition: Defective
Vintage: 2005

Price: click here for enquiry
SKU: SEM-FEI-023 Category:

All our used electron microscopes are certified second hand equipment

  • Condition certificate provided
  • On-site installation
  • No-Risk warranty period

** MAIN FEATURES **
This microscope has been used in a facility lab and in two main areas: biosciences and materials science.

** BEAM **
– Tungsten emitter with acceleration voltage range [1-30] KV (we can supply 50 new filaments).

** RESOLUTION **
– The last resolution test (26/01/2026) gave a resolution of 100 nm, using a Tin-on-Carbon sample and a BSE detector.

** DETECTORS **
– LFD secondary electrons [Low Vacuum]
– GSED secondary electrons [ESEM mode]
– GBSD secondary and back-scattered electrons () [Low Vacuum]
– GAD Analytical back-scattered electrons [Low Vacuum]
– Detector X-EDS Oxford INCA-350 Si(Li), LN cooled, thin window; software and hardware for qualitative, quantitative analysis, mapping, line&grids analysis.
The secondary electron detector and the BSE detector are defective. Repair/Replacement can be arrange.

** STAGE **
– 50×50 mm, 4-axis motorised, Z range 25mm, manual tilt control range [-15 ÷ 75].

** ACCESSORIES **
– Two rotary vacuum pumps and the standard TMP.
– Two Hot-Stages for High temperature analysis [max temp 1000 and 1500 °C] and a Peltier stage.
– Kit for removing tube apertures, flanges,…
– No chiller or compressor, the tool is currently connected to a facility supplier.

** CONDITION **
– The secondary electron detector and the BSE detector are defective. Repair/Replacement can be arrange.
– Do not work in Low Vacuum/ESEM mode.

Availability check

2026-02-03

Manufacturer

FEI

Product condition

Defective

Vintage

2005