Manufacturer
TVIPS
Model
TemCam-XF416 – Technical Description
Ultra-Fast Readout
Thanks to its optimized CMOS readout architecture, the TemCam-XF416 supports high acquisition speeds across full-frame and sub-area modes:
Up to 24 fps at full resolution (4096 × 4096)
Up to ~190 fps using reduced regions of interest (e.g. 512 × 4096 or 1024 × 4096)
This performance makes the camera suitable for dynamic TEM experiments, fast diffraction, and selected in-situ applications where moderate frame rates are sufficient.
Dynamic Range
The TemCam-XF416 provides a high dynamic range suitable for both imaging and diffraction applications.
(Standard XF416 does not support the extended dual-readout mode available on the ES version.)
Real-Time Drift Correction
Using the EM-MENU software environment, real-time drift correction can be applied during acquisition.
This improves image sharpness and stability, particularly for long exposures and low-dose imaging workflows.
Fiber-Optical Electron Coupling
The camera uses 1:1 fiber-optical coupling between the scintillator and the CMOS sensor:
Higher light collection efficiency than lens-coupled systems
Improved sensitivity and signal-to-noise ratio
No optical distortion
Sensor Cooling & Vacuum Architecture
Thermo-electrically cooled (TEC) CMOS sensor
Sensor located in a dedicated vacuum housing, isolated from the microscope vacuum
Scintillator maintained at room temperature
This architecture minimizes contamination risk and allows venting of the camera chamber without warming the CMOS sensor.
Optimized Scintillator Options
TVIPS provides scintillators optimized for different acceleration voltages:
Electron energies from 6 kV up to 400 kV
Two standard options:
High-resolution optimized
High-sensitivity optimized
Custom scintillators available on request
Technical Specifications – TemCam-XF416
Sensor & Imaging
Sensor type: CMOS
Active format: 4096 × 4096 pixels
Pixel size: 15.5 × 15.5 µm²
Fill factor: 72 %
Effective field of view: 63.5 × 63.5 mm²
Readout & Performance
Digitization: 16-bit
Readout rate: 32 × 16 (32) megapixels/s
Frame rates (typical):
24 fps @ 4k × 4k
~95 fps @ 1k × 4k
~190 fps @ 512 × 4k
Image Quality
Signal-to-noise ratio: ~29:1 @ 200 kV (typical)
Non-linearity: < 1 % (after flat-field correction)
Resolution: ~20 % NTF at Nyquist frequency (200 kV)
Anti-blooming: Blooming not present
Acquisition Modes
Full frame
Sub-area / ROI
Binning: 1×, 2×, 4×, 8×
Continuous acquisition
Tomography and single-particle workflows
Mechanical Integration
Mounting: Bottom-mounted
Configuration: On-axis or retractable
System Requirements
Operating system: Windows 10
CPU: Intel Quad-Core or higher
Data interface: 40 GbE optical
Expansion: PCI Express ×16
Software
EM-MENU
Tomography module
Single Particle Collection
EM-SPECTRO
In-situ recording package (direct-to-disk)
was installed on a FEI Tecnai
