The JEOL EM-BST is a precision single-tilt specimen holder designed for JEOL transmission electron microscopes (TEM). It allows controlled sample tilting for advanced imaging and diffraction experiments, helping researchers optimize specimen orientation for structural and crystallographic analysis.
Key Features
Manufacturer: JEOL Ltd. (Tokyo, Japan)
Model: EM-BST
Serial number: EM705049-74
Type: Single-axis specimen tilt holder
Tilt range: typically ±30° to ±40° (depending on pole-piece)
Grid size: accepts standard 3.05 mm TEM grids
Construction: precision-machined metal shaft, integrated rotary tilt control
Storage: supplied in original protective case
Compatibility
The EM-BST is compatible with a range of JEOL TEMs, including:
JEM-100 series (JEM-100B, JEM-100C, JEM-100CX)
JEM-200 series (JEM-200, JEM-2000, JEM-2100)
Other JEOL TEMs with side-entry goniometer stages designed for 3 mm grids
⚠️ Note: Compatibility depends on the pole-piece gap. Not recommended for modern Cs-corrected or narrow-gap HR pole pieces. Please confirm before purchase.
Condition
Regen Microscopy Certified
Used – inspected and in good condition
Stored in original protective case
Fully functional mechanical tilt and electrical connection
Applications
✔ Diffraction experiments
✔ Tomography / tilt series imaging
✔ Crystallographic orientation analysis
